N-type silicon wafer

N-type silicon wafer

Specifications

183.75*182mm

Size:

120±10μm

Thickness:

≤11ppma

Oxygen content:

Highlights

Size: 183.75*182mm, thickness: 130μm

Size: 183.75*182mm, thickness: 130μm

Ultra-high surface flatness control technology, with an average total thickness deviation of ≤8 μm

Ultra-high surface flatness control technology, with an average total thickness deviation of ≤8 μm

Comprehensive solution for efficient and intelligent cutting, with an average surface line mark of ≤8  μm

Comprehensive solution for efficient and intelligent cutting, with an average surface line mark of ≤8 μm

Ultra-fine wire rapid cutting, with reduced damage and lower thermal stress

Ultra-fine wire rapid cutting, with reduced damage and lower thermal stress

Parameters

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