N-type silicon wafer

N-type silicon wafer

Specifications

210*182.2mm

Size:

130μm

Thickness:

≤12ppma

Oxygen content:

Highlights

Size: 210*210mm, thickness: 130μm

Size: 210*210mm, thickness: 130μm

Ultra-high surface flatness control technology, with an average total thickness deviation of ≤8 μm

Ultra-high surface flatness control technology, with an average total thickness deviation of ≤8 μm

Comprehensive solution for efficient and intelligent cutting, with an average surface line mark of ≤8  μm

Comprehensive solution for efficient and intelligent cutting, with an average surface line mark of ≤8 μm

Ultra-fine wire rapid cutting, with reduced damage and lower thermal stress

Ultra-fine wire rapid cutting, with reduced damage and lower thermal stress

Parameters

Related Products